Showing results: 1411 - 1425 of 4352 items found.
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MICRONIX
The necessity of a wireless system test has risen by the spread of recent wireless telecommunication equipment as shown in cellular phone, wireless LAN, RF-ID tag and ETC (Electronic Toll Collection system). It is necessary for a wireless test to be performed in anechoic environment in which an external noise is intercepted and a radio wave does not reflect internally. An anechoic chamber (room version of a shield box) is proper facilities but needs a wide space and a huge cost. Especially, the equipment under wireless system test on the production line can not radiate any signal radio wave outside before approval. The shield box satisfies these conditions.
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ACMAS Technologies Pvt. Ltd.
Vibration and Temperature & Humidity & Vibration Combined Test Chamber offer combined temperature, humidity, and/or vibration environments. Weiber models are designed for compatibility with user’s choice of electrodynamic or mechanical vibration systems. While each model is manufactured to standard designs, they may also be custom engineered to meet a wide range of stringent test requirements. The Test Chamber comes with optional capability to interface with vibration systems in both the horizontal and vertical modes of operation with rear or vertical sliding doors. The Weiber Series temperature/humidity and vibration chambers are designed to integrate with vibration systems in only the vertical mode of operation.
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DMC, Inc.
DMC's Battery Pack Test Systems facilitate battery design as well as research and development for national laboratories and research institutions. They are deployed in end of line / production test stations for battery packs developed by major automotive manufacturers and their suppliers. DMC's battery pack test systems are designed to evaluate the battery as a complete system and validate a comprehensive range of battery pack functionalities, including:Power performance, Capacity, DCR / Internal ResistanceContactor and safety interlock functionsIsolation / Insulation ResistancesReporting of operating data through external communication interfaces (usually CAN)Cell VoltagesPack / Cell TemperaturesState of ChargeFaults / Diagnostic Trouble Codes (DTCs)Etc.Electrical characteristics / continuity of internal pack wiring / signalsCooling system operation
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ECR Series -
Jinan Testing Equipment IE Corporation
This series of computer control electronic creep and rupture testing machine is newly designed with full-digital measuring control system to meet the standards of GB/T2039, GB//T20120, EN ISO 204-2009 and ASTM E139 etc. The electronic creep and rupture testing system can perform not simply creep. stress-rupture test and stress relaxation test on metals under room or high temperatures, but also low cycling test & creep fatigue test. The electronic creep and rupture testing machine is widely used for quality control in factories, material research in R&D department and teaching in universities,
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Cyth Systems, Inc
Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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ReMaTek
In addition to In-circuit testing, functional testing is widely used in the industry to verify electronic cards. This is why ReMaTek has always paid a special attention to the specific requirements of functional testing. Our dedicated engineering staff is prepared to handle all of your mechanical, electrical and software requirements. We are aiming particularly the small turn-key test systems where all the elements; the mechanical fixture, the test equipment and the test software, are put together in a complete system.
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Data Patterns Pvt. Ltd.
The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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CONFORMIQ TRANSFORMER -
Conformiq Inc
Conformiq Transformer shortens the path to test automation, simplifies model-based testing (MBT) adoption using existing methods, and automates manual test execution. Along with Conformiq Creator, which generates executable test cases, scripts and documentation from models, it automates and transforms test design, extending the Conformiq 360° Test Automation™ solution for complex system testing at the speed of development.
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SilverLine -
Times Microwave Systems
SilverLine® Test Cable Assemblies. These test cables are cost-effective, durable, high-performance cable assemblies designed for use in a broad range of test and interconnect applications. SilverLine assemblies provide long life and excellent stability in applications where they are repeatedly flexed and mated/unmated. SilverLine assemblies are economical enough to be used as interconnects in test systems and are ideal for use in production, field and laboratory test environments.
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Clover -
Atlassian
Clover provides the metrics you need to better balance the effort between writing code that does stuff, and code that tests stuff. Clover runs in your IDE or your continuous integration system, and includes test optimization to make your tests run faster, and fail more quickly.
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adaptronic Prüftechnik GmbH
*Hand adapters*Combi adapters*Service adapters*Rigging harnesses*Hand over adapters for engine test benches*Cockpit test systems*Special test benches ...*For every adaptation job the fitting adapter - application specific, reliable, robust with threaded and spring loaded contact pins.
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Metal Samples Company
The Metal Samples CP/ER Test Station provides an integrated solution for monitoring the effectiveness of a cathodic protection system. The test station offers an integrated ER corrosion probe element, a CP ring coupon, and a standard CP test station terminal enclosure for making connections and conducting measurements.
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Ai-710 -
Teradyne, Inc.
The Ai-710 is a Core System Instrument (CSi)—a single-slot, multi-function VXI analog test instrument. It eliminates the requirement for multiple discrete instruments that often provide inadequate test coverage for newer Units Under Test (UUTs). The single-slot VXI form factor reduces tester footprint, as well.
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Amida Technology, Inc.
AMIDA 5000 is a high-end performance test system, combining analog, mixed-signal and logic with the latest test solutions. High pin count - as many as 512 smart multi-function pinframes and 128 sites. Ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. This system has a higher number of parallel tests and a higher level of capability. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The 5000 series test system is the best analog, mixed signal, digital IC, PA test system for engineering verification and mass production. It can be easily connected to all well-known wafer probing machines and sorters, and also supports parallel test functions. The 5000 series meets customers' needs for high-precision, high-resolution, high-reliability, user-friendly, and low-cost testing and measurement of test systems.
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Photo Emission Tech., Inc.
QE system provides electronics and software designed for fully automated measurement of external quantum efficiency of solar cells. All systems include probes and a fixed plate sample stage for samples up to 150 mm x 150 mm. The main system components include: custom designed software, measurement electronics, and computer system (Windows 8 operating system). The measurement involves focusing monochromatic light to a spot on the device under test, then accurately measuring the photon flux and current from the test cell. The system utilizes a dual beam configuration with lock-in detection, providing an absolute accuracy of ±3%. The QE system uses a grating monochrometer with silicon/InGaAs/Ge detectors. The system includes automatic order sorting filters and two light sources for monochromatic illumination (a Xenon- arc lamp and a halogen lamp). A single lock-in amplifier is used to measure both the reference detector and test device. The main system comes with all the hardware needed to measure quantum efficiency, a fixed plate sample stage and probes.
